Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometryHellen Cristine Santos Tiago Fiorini da Silva; Alisson Rodolfo Leite; Renan Ferreira de Assis; Pedro Herzilio Ottoni Viviani de Campos; Marcia de Almeida Rizzutto; Manfredo Harri TabacniksJournal of Applied Physics New York: AIP Publishing, 2019 v. 126, n. 4, 10.1063, 1.5108746New York 2019Item não circula. Consulte sua biblioteca.(Acessar) |
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2 |
Material Type: Artigo
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Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffractionRaul de Oliveira Freitas A. A Quivy (Alain André); Sérgio Luiz MorelhãoJournal of Applied Physics, v. 105, n. 3, p. 036104-1/-03104/3Melville 2009Acesso online |
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3 |
Material Type: Artigo
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Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffractionRaul de Oliveira Freitas A. A Quivy (Alain André); Sérgio Luiz MorelhãoJournal of Applied Physics, v. 105, n. 3, p. 036104-1/-03104/3Melville 2009Acesso online |
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4 |
Material Type: Artigo
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Electron backscattered diffraction texture analysis of 'SmCo IND.5' magnetsMarcos Flavio de Campos Taeko Yonamine; Marcos Fukuhara; Rogerio Machado; Sergio Romero; Fernando José Gomes Landgraf 1954-; Daniel Rodrigues; Frank Patrick MissellJournal of Applied Physics v. 101, n. 9, p. 09K516/1-09K516/3New York 2007Acesso online |
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5 |
Material Type: Artigo
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Electron backscattered diffraction texture analysis of 'SmCo IND.5' magnetsMarcos Flavio de Campos Taeko Yonamine; Marcos Fukuhara; Rogerio Machado; Sergio Romero; Fernando José Gomes Landgraf 1954-; Daniel Rodrigues; Frank Patrick MissellJournal of Applied Physics v. 101, n. 9, p. 09K516/1-09K516/3New York 2007Acesso online |
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6 |
Material Type: Artigo
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High resolution x-ray diffraction analysis of InGaAs/InP superlatticesD. M. Cornet R. R LaPierre; D Comedi; Yuri A PusepJournal of Applied Physics Melville v. 100, n. 4, p. 043518-1-043518-6, Aug. 2006Melville 2006Localização: IFSC - Inst. Física de São Carlos (PROD012615 )(Acessar) |
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7 |
Material Type: Artigo
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High resolution x-ray diffraction analysis of InGaAs/InP superlatticesD. M. Cornet R. R LaPierre; D Comedi; Yuri A PusepJournal of Applied Physics Melville v. 100, n. 4, p. 043518-1-043518-6, Aug. 2006Melville 2006Localização: IFSC - Inst. Física de São Carlos (PROD012615 )(Acessar) |
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8 |
Material Type: Artigo
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Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffractionS Martini A. A Quivy (Alain André); M J da Silva; T E Lamas; E C F da Silva; J. R Leite (José Roberto); E AbramofJournal of Applied Physics v. 94, n. 11, p. 7050-7052, 2003New york 2003Acesso online |
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9 |
Material Type: Artigo
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Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffractionS Martini A. A Quivy (Alain André); M J da Silva; T E Lamas; E C F da Silva; J. R Leite (José Roberto); E AbramofJournal of Applied Physics v. 94, n. 11, p. 7050-7052, 2003New york 2003Acesso online |