Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Resenha
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Introduction to MicroprocessorsMather, A. P. ; Desai, R. C.IEEE Transactions on Systems, Man, and Cybernetics, 1981, Vol.11 (10), p.731-732IEEETexto completo disponível |
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2 |
Material Type: Resenha
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Book reviews - Computer network architecturesLi, V.IEEE Communications Magazine, 1983, Vol.21 (4), p.47-47IEEETexto completo disponível |
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3 |
Material Type: Resenha
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Book reviews - Local networks, an introductionRympalski, W.IEEE Communications Magazine, 1984, Vol.22 (7), p.34-34IEEETexto completo disponível |
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4 |
Material Type: Resenha
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Designing Knowledge-Based SystemsAddis, T. R. ; Sastry, Mudigonda N.IEEE Expert, 1986, Vol.1 (4), p.91-91IEEETexto completo disponível |
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5 |
Material Type: Resenha
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Book reviews - Local area and multiple access networksAugerson, S.IEEE Communications Magazine, 1987, Vol.25 (5), p.67-67IEEETexto completo disponível |
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6 |
Material Type: Resenha
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Book ReviewsIEEE Software, 1988, Vol.5 (3), p.125 [Periódico revisado por pares]Los Alamitos: IEEE Computer SocietyTexto completo disponível |
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7 |
Material Type: Resenha
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The Winn L. Rosch Hardware Bible, Second EditionZalewski, JanuszComputer, 1994, Vol.27 (5), p.109 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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8 |
Material Type: Resenha
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Synario 1.0Jagadeesh, J MComputer, 1994, Vol.27 (5), p.82 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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9 |
Material Type: Resenha
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WindowsMaker 5.0Pappas, T LComputer, 1994, Vol.27 (5), p.81 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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10 |
Material Type: Resenha
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StateCAD version 1.11Cratty, John ; Jagadeesh, J MComputer, 1994, Vol.27 (5), p.84 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |