Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Voltage dependence of the tunnelling current: An exact expressionNoguera, ClaudineThe Monthly Microscopical Journal, 1870-02, Vol.3 (2), p.3-9 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
2 |
Material Type: Artigo
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Scanning tunnelling microscopy on reconstructed Si(110)Neddermeyer, H. ; Tosch, StThe Monthly Microscopical Journal, 1870-02, Vol.3 (2), p.149-156 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
3 |
Material Type: Artigo
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STM imaging of noble metal electrodes in solution under potentiostatic controlOtsuka, I. ; Iwasaki, T.The Monthly Microscopical Journal, 1870-02, Vol.3 (2), p.289-297 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
4 |
Material Type: Artigo
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Study of 4Hb-TaS2 and graphite intercalation compound by STM/STSTanaka, M. ; Mizutani, W. ; Nakashizu, T. ; Morita, N. ; Yamazaki, S. ; Bando, H. ; Ono, M. ; Kajimura, K.The Monthly Microscopical Journal, 1870-02, Vol.3 (2), p.183-192 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
5 |
Material Type: Artigo
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Scanning tunnelling microscopy studies of heteroepitaxy: CaF2 on Si(111)Wolkow, R. ; Avouris, PhThe Monthly Microscopical Journal, 1870-02, Vol.3 (2), p.167-173 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
6 |
Material Type: Artigo
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Nucleation and growth of Cu and Ag on Si(111)7×7Tosch, St ; Neddermeyer, H.The Monthly Microscopical Journal, 1870-03, Vol.3 (3), p.415-422 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
7 |
Material Type: Artigo
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STM of layered-structure semiconductorsHenson, Tammy D. ; Sarid, Dror ; Bell, L. StephenThe Monthly Microscopical Journal, 1870-03, Vol.3 (3), p.467-472 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
8 |
Material Type: Artigo
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Study of Au surfaces by scanning tunnelling microscopyKuk, Y. ; Silverman, P. J. ; Chua, F. M.The Monthly Microscopical Journal, 1870-03, Vol.3 (3), p.449-457 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
9 |
Material Type: Artigo
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The STM learning curve and where it may take usDemuth, J. E. ; Koehler, U. ; Hamers, R. J.The Monthly Microscopical Journal, 1870-03, Vol.3 (3), p.299-316 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
10 |
Material Type: Artigo
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STM study of the effects of pulsed laser irradiation on semiconductor surfacesTomitori, Masahiko ; Katsuki, Futoshi ; Nishikawa, OsamuThe Monthly Microscopical Journal, 1870-03, Vol.3 (3), p.337-345 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |