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Determining amplitude and tilt of a lateral force microscopy sensorGretz, Oliver ; Weymouth, Alfred J ; Holzmann, Thomas ; Pürckhauer, Korbinian ; Giessibl, Franz JBeilstein journal of nanotechnology, 2021-06, Vol.12 (1), p.517-524 [Periódico revisado por pares]Germany: Beilstein-Institut zur Föerderung der Chemischen WissenschaftenTexto completo disponível |