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Material Type: Article
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DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices
Sara Dereste dos Santos Talitha Nicoletti; João Antonio Martino 1959-; Eddy Simoen; Cor Claeys
Microelectronics Technology and Devices - SBMicro 2010 v.31, n.1, p. 51-58, 2010
New Jersey 2010
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