Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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0 + 1 > 1: How Adding Noninformative Sound Improves Performance on a Visual TaskKim, Robyn ; Peters, Megan A. K. ; Shams, LadanPsychological science, 2012-01, Vol.23 (1), p.6-12 [Periódico revisado por pares]Los Angeles, CA: SAGE PublicationsTexto completo disponível |
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2 |
Material Type: Artigo
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0.04-mm2 103-dB-A Dynamic Range Second-Order VCO-Based Audio \Sigma\Delta ADC in 0.13- \mu m CMOSCardes, Fernando ; Gutierrez, Eric ; Quintero, Andres ; Buffa, Cesare ; Wiesbauer, Andreas ; Hernandez, LuisIEEE journal of solid-state circuits, 2018-06, Vol.53 (6), p.1731-1742 [Periódico revisado por pares]IEEETexto completo disponível |
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3 |
Material Type: Ata de Congresso
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0.1 mu m contact metallization with SiH/sub 2/F/sub 2/-reduced CVD WYokoyama, N. ; Kumura, S. ; Yoshimura, T. ; Goto, H. ; Kobayashi, N. ; Homma, Y. ; Takeda, E.1992 Symposium on VLSI Technology Digest of Technical Papers, 1992, p.68-69IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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0.1-/spl mu/m CMOS technology for high-speed logic and system LSIs with SiO/SiN/poly-Si/W gate-systemOnai, T. ; Tsujikawa, S. ; Uchino, T. ; Tsuchiya, R. ; Ohnishi, K. ; Fukuda, H. ; Hisamoto, D. ; Yamamoto, N. ; Yugami, J. ; Ichinose, K. ; Ootsuka, F.International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318), 1999, p.937-939IEEETexto completo disponível |
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Material Type: Ata de Congresso
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0.1-/spl mu/m GaAs MESFET's fabricated using ion-implantation and photolithographyYamane, Y. ; Nishimura, K. ; Inoue, K. ; Tokumitsu, M.15th Annual GaAs IC Symposium, 1993, p.185-188IEEETexto completo disponível |
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6 |
Material Type: Livro
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10 años de investigaciones económicas en la Red Mercosur [1998-2008]Red de Investigaciones Económicas del MercosurMontevideo, Uruguay Red Mercosur 2008Localização: IRI - Inst. Rel. Internacionais (337.18 D568 )(Acessar) |
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7 |
Material Type: Livro
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13th IEEE VLSI Test Symposium April 30-May 3, 1995, Princeton, New Jersey : proceedingsIEEE VLSI Test Symposium (13th 1995 Princeton, N.J.) IEEE Computer Society Test Technology Technical Committee; Institution of Electrical and Electronics Engineers Philadelphia SectionLos Alamitos, Calif. IEEE Computer Society Press c1995Localização: EPBC - Esc. Politécnica-Bib Central (621.3.049.771.15 Ie2v 13. )(Acessar) |
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8 |
Material Type: Artigo
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A 0-1 LP Model for the Integration and Consolidation of Air Cargo ShipmentsLeung, Lawrence C ; Van Hui, Yer ; Wang, Yong ; Chen, GangOperations research, 2009-03, Vol.57 (2), p.402-412 [Periódico revisado por pares]Hanover, MD: INFORMSTexto completo disponível |
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9 |
Material Type: Artigo
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A 0.0043-mm2 0.085-μW/MHz Relaxation Oscillator Using Charge-Prestored Asymmetric Swings R-RC NetworkWei, Yuchen ; Yang, Shiheng ; Liu, Yueduo ; Bao, Rongxin ; Zhu, Zihao ; Lin, Jiahui ; Zhang, Zehao ; Chen, Yong ; Yin, Jun ; Mak, Pui-In ; Li, QiangIEEE transactions on very large scale integration (VLSI) systems, 2023-08, Vol.31 (8), p.1248-1252 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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10 |
Material Type: Ata de Congresso
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A 0.0058mm2 7.0 ENOB 24MS/s 17fJ/conv. threshold configuring SAR ADC with source voltage shifting and interpolation techniqueYoshioka, Kentaro ; Shikata, Akira ; Sekimoto, Ryota ; Kuroda, Tadahiro ; Ishikuro, Hiroki2013 Symposium on VLSI Circuits, 2013, p.C266-C267IEEETexto completo disponível |