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Proceedings of the 15th International Conference on Defects in Semiconductors Budapest, Hungary, August 22-26, 1988
Proceedings of the 15th International Conference on Defects in Semiconductors Budapest, Hungary, August 22-26, 1988
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Proceedings of the 15th International Conference on Defects in Semiconductors Budapest, Hungary, August 22-26, 1988

International Conference on Defects in Semiconductors (15th 1988 Budapest, Hungary) G Ferenczi 1946- (György)

Aedermannsdorf, Switzerland Trans Tech Brookfield, VT c1989

Localização: IF - Instituto de Física    (MS MASCF v.38-41 pt.3 ex.2 )(Acessar)

2
Proceedings of the 13th International Conference on Defects in Semiconductors
Proceedings of the 13th International Conference on Defects in Semiconductors
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Proceedings of the 13th International Conference on Defects in Semiconductors

International Conference on Defects in Semiconductors (13th 1984 Coronado, Calif.) L. C Kimerling; J. M Parsey 1953- (John Michael); Metallurgical Society of AIME Electronic Materials Committee

Warrendale, Pa. Metallurgical Society of AIME c1985

Localização: IF - Instituto de Física    (537.62206 I61d 13th )(Acessar)

3
Papers presented at the 10th International Conference on Extended Defects in Semiconductors, Chernogolovka, Russia, 11-17 September 2004.
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Papers presented at the 10th International Conference on Extended Defects in Semiconductors, Chernogolovka, Russia, 11-17 September 2004.

International Conference on Extended Defects in Semiconductors (10th : 2004 : Chernogolovka, Russia)

Berlin : Wiley-VCH 2005

Localização: IF - Instituto de Física    (MS PHSSC v.2 n.6 )(Acessar)

4
Papers presented at the International Conference on Extended Defects in Semiconductors (EDS 2008) : Poitiers-Futurscope, France, 14-19 September 2008
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Papers presented at the International Conference on Extended Defects in Semiconductors (EDS 2008) : Poitiers-Futurscope, France, 14-19 September 2008

International Conference on Extended Defects in Semiconductors (2008 : Poitiers-Futurscope, France) Eric Le Bourhis; Jacques Rabier

Weinheim : Wiley-VCH c2009

Localização: IF - Instituto de Física    (MS PHSSC v.6 n.8 )(Acessar)

5
Papers from the 10th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors
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Papers from the 10th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors

International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (10th 2003 Batz-sur-Mer, France) J. P Landesman (Jean-Pierre); P. C Montgomery (Paul C.)

Issued as: European physical journal. Applied physics v. 27, no. 27, no. 1-3 (July-Sept. 2004)

Ulis Cedex A, France EDP Sciences c2004

Localização: IF - Instituto de Física    (Eur.Phys.J v.27 n.1-3 2004 )(Acessar)

6
Defects and properties of semiconductors defect engineering
Defects and properties of semiconductors defect engineering
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Defects and properties of semiconductors defect engineering

J Chikawa 1930- (Junichi); K Sumino 1931- (Kåoji); K Wada 1950- (Kazumi); Society of Non-Traditional Technology (Japan); Symposium on "Defects and Qualities of Semiconductors" (1984 Tokyo, Japan)

Tokyo KTK Scientific Dordrecht Boston D. Reidel Norwell, MA, U.S.A. Distributed in the U.S.A. and Canada by Kluwer Academic c1987

Localização: EPBC - Esc. Politécnica-Bib Central    (621.3.032 Sy68d )(Acessar)

7
Defects in electronic materials II symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
Defects in electronic materials II symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
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Defects in electronic materials II symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.

Jurgen Michel

Pittsburgh, Penn Materials Research Society c1997

Localização: IF - Instituto de Física    (621.06 M425 v.442 )(Acessar)

8
Shallow impurities in semiconductors proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors : "Physics and Control of Impurities", International Conference Center, Kobe, Japan, 5 to 8 August 1992
Shallow impurities in semiconductors proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors : "Physics and Control of Impurities", International Conference Center, Kobe, Japan, 5 to 8 August 1992
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Shallow impurities in semiconductors proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors : "Physics and Control of Impurities", International Conference Center, Kobe, Japan, 5 to 8 August 1992

International Conference on Shallow Impurities in Semiconductors (5th 1992 Kobe, Japan) Tsunemasa Taguchi

Aedernabbsdorf, Switzerland Trans Tech Publications Brookfield, VT 1993

Localização: IF - Instituto de Física    (MS MASCF v.117-118 )(Acessar)

9
Defects in semiconductors proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.
Defects in semiconductors proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.
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Defects in semiconductors proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.

J Narayan (Jagdish); T. Y Tan; Materials Research Society

New York North Holland c1981

Localização: IF - Instituto de Física    (621.06 M425 v.2 pt.1 ) e outros locais(Acessar)

10
Proceedings of the 17th International Conference on Defects in Semiconductors ICDS-17 : Gmunden, Austria, July 18-23, 1993
Proceedings of the 17th International Conference on Defects in Semiconductors ICDS-17 : Gmunden, Austria, July 18-23, 1993
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Proceedings of the 17th International Conference on Defects in Semiconductors ICDS-17 : Gmunden, Austria, July 18-23, 1993

International Conference on Defects in Semiconductors (17th 1993 Gmunden, Austria) Helmut Heinrich; Wolfgang Jantsch 1946-

Zurich, Switzerland Trans Tech Publications Brookfield, VT, USA c1994

Localização: IF - Instituto de Física    (MS MASCF v.143-147 pt.3 )(Acessar)

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