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Papers presented at the International Conference on Extended Defects in Semiconductors (EDS 2008) : Poitiers-Futurscope, France, 14-19 September 2008
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Papers presented at the International Conference on Extended Defects in Semiconductors (EDS 2008) : Poitiers-Futurscope, France, 14-19 September 2008

International Conference on Extended Defects in Semiconductors (2008 : Poitiers-Futurscope, France) Eric Le Bourhis; Jacques Rabier

Weinheim : Wiley-VCH c2009

Localização: IF - Instituto de Física    (MS PHSSC v.6 n.8 )(Acessar)

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Deste Autor:

  1. Le Bourhis, E
  2. Rabier, J
  3. International Conference on Extended Defects in Semiconductors

Neste Assunto:

  1. Semiconductors
  2. Semicondutores (Congressos)

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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