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1
Au-delà du principe de pouvoir
Au-delà du principe de pouvoir
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Au-delà du principe de pouvoir

François Laruelle

Paris Payot 1978

Available at FFLCH - Fac. Fil. Let. e Ciências Humanas    (320.1 L336a )(GetIt)

2
Théorie des identités fractalité généralisée et philosophie artificielle
Théorie des identités fractalité généralisée et philosophie artificielle
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Théorie des identités fractalité généralisée et philosophie artificielle

François Laruelle

Paris Presses universitaires de France c1992

Available at ECA - Escola de Comunicações e Artes    (194 L336t )(GetIt)

3
Machines textuelles déconstruction et libido d'écriture
Material Type:
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Machines textuelles déconstruction et libido d'écriture

François Laruelle

Paris Les Éditions du Seuil c1976

Available at FFLCH - Fac. Fil. Let. e Ciências Humanas    (801.92 L346m e.2 )(GetIt)

4
Introduction to non-Marxism
Introduction to non-Marxism
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Introduction to non-Marxism

François Laruelle 1937- Anthony Paul Smith 1982- trad

Minneapolis Univocal 2015

Available at FEA - Fac. Econ. Adm. Contab. e Atuária  ACERVO DELFIM NETTO  (C10.32.47 )(GetIt)

5
Le signe et la technique la philosophie à l'épreuve de la technique
Le signe et la technique la philosophie à l'épreuve de la technique
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Le signe et la technique la philosophie à l'épreuve de la technique

Gilbert Hottois 1946- Jacques Ellul 1912-1994; François Laruelle

Paris Aubier c1984

Available at IEB - Inst. Estudos Brasileiros  MILTON SANTOS  (MS 601 H834s )(GetIt)

6
Du mode d'existence des objets techniques
Du mode d'existence des objets techniques
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Du mode d'existence des objets techniques

Gilbert Simondon 1924-1989 John Hart; Yves Deforge; François Laruelle

Paris Aubier 1989

Available at IEB - Inst. Estudos Brasileiros  MILTON SANTOS  (MS 194 S597d )(GetIt)

7
Mechanical strain mapping of GaAs based VCSELs
Mechanical strain mapping of GaAs based VCSELs
Material Type:
Article 		Add to e-Shelf

Mechanical strain mapping of GaAs based VCSELs

Mokhtari, Merwan ; Pagnod-Rossiaux, Philippe ; Levallois, Christophe ; Laruelle, François ; Cassidy, Daniel T. ; Bettiati, Mauro ; Landesman, Jean-Pierre

Applied physics letters, 2021-03, Vol.118 (9) [Peer Reviewed Journal]

Melville: American Institute of Physics

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8
Mechanical stress in InP and GaAs ridges formed by reactive ion etching
Mechanical stress in InP and GaAs ridges formed by reactive ion etching
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Mechanical stress in InP and GaAs ridges formed by reactive ion etching

Landesman, Jean-Pierre ; Fouchier, Marc ; Pargon, Erwine ; Gérard, Solène ; Rochat, Névine ; Levallois, Christophe ; Mokhtari, Merwan ; Pagnod-Rossiaux, Philippe ; Laruelle, François ; Petit-Etienne, Camille ; Bettiati, Mauro ; Jiménez, Juan ; Cassidy, Daniel T.

Journal of applied physics, 2020-12, Vol.128 (22) [Peer Reviewed Journal]

Melville: American Institute of Physics

Full text available

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9
Photoluminescence mapping of the strain induced in InP and GaAs substrates by SiNx stripes etched from thin films grown under controlled mechanical stress
Photoluminescence mapping of the strain induced in InP and GaAs substrates by SiNx stripes etched from thin films grown under controlled mechanical stress
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Photoluminescence mapping of the strain induced in InP and GaAs substrates by SiNx stripes etched from thin films grown under controlled mechanical stress

Gérard, Solène ; Mokhtari, Merwan ; Landesman, Jean-Pierre ; Levallois, Christophe ; Fouchier, Marc ; Pargon, Erwine ; Pagnod-Rossiaux, Philippe ; Laruelle, François ; Moréac, Alain ; Ahammou, Brahim ; Cassidy, Daniel T.

Thin solid films, 2020-07, Vol.706, Article 138079 [Peer Reviewed Journal]

Elsevier B.V

Full text available

Citations Cited by
10
Photoluminescence mapping of the strain induced in InP and GaAs substrates by SiN stripes etched from thin films grown under controlled mechanical stress
Photoluminescence mapping of the strain induced in InP and GaAs substrates by SiN stripes etched from thin films grown under controlled mechanical stress
Material Type:
Article 		Add to e-Shelf

Photoluminescence mapping of the strain induced in InP and GaAs substrates by SiN stripes etched from thin films grown under controlled mechanical stress

Gérard, Solène ; Mokhtari, Merwan ; Landesman, Jean-Pierre ; Levallois, Christophe ; Fouchier, Marc ; Pargon, Erwine ; Pagnod-Rossiaux, Philippe ; Laruelle, François ; Moréac, Alain ; Ahammou, Brahim ; Cassidy, Daniel T.

Thin solid films, 2020-07, Vol.706, p.138079, Article 138079 [Peer Reviewed Journal]

Elsevier

Full text available

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