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1 |
Material Type: Artigo
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Scanning tunnelling engineeringSchneiker, Conrad ; Hameroff, Stuart ; Voelker, Mark ; He, Jackson ; Dereniak, Eustace ; McCuskey, RobertThe Monthly Microscopical Journal, 1870-03, Vol.3 (3), p.585-596 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
2 |
Material Type: Livro
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3 |
Material Type: Livro
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Topics in Fluorescence Spectroscopy: DNA TechnologyLakowicz, Joseph RSpringer 1900Texto completo disponível |
4 |
Material Type: Livro
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Plastics Design Library, 1Flick, Ernest WSan Diego: Elsevier Science & Technology 1956Texto completo disponível |
5 |
Material Type: Artigo
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Measurement of Activity of Single Molecules of β -D-galactosidaseRotman, BorisProceedings of the National Academy of Sciences - PNAS, 1961-12, Vol.47 (12), p.1981-1991 [Periódico revisado por pares]United States: National Academy of Sciences of the United States of AmericaTexto completo disponível |
6 |
Material Type: Livro
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Progress in Inorganic Chemistry, Volume 4Cotton, F. AlbertNewark: John Wiley & Sons, Incorporated 1962Texto completo disponível |
7 |
Material Type: Livro
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Progress in Inorganic Chemistry, Volume 6Cotton, F. AlbertNewark: John Wiley & Sons, Incorporated 1964Texto completo disponível |
8 |
Material Type: Artigo
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A new functional device performing a flip-flop circuit functionAmbroziak, A.Microelectronics and reliability, 1966-01, Vol.5 (4), p.343,IN25,345-344,IN26,345 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
9 |
Material Type: Artigo
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Localized breakdown in Ge mesa diodes due to inclusionsSulway, D.V. ; Davies, I.G. ; Hughes, K.A. ; Thornton, P.R. ; Holeman, B.R.Microelectronics and reliability, 1966-01, Vol.5 (4), p.323,IN21,325-324,IN24,327 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
10 |
Material Type: Artigo
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The use of equivalent networks to minimize the tolerance of passive thin film circuitsNeuman, M.R. ; Ko, Wen-HsiungMicroelectronics and reliability, 1966-01, Vol.5 (4), p.329-335 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |