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Finer resolution observation and monitoring of global land cover: first mapping results with Landsat TM and ETM+ dataGong, Peng ; Wang, Jie ; Yu, Le ; Zhao, Yongchao ; Zhao, Yuanyuan ; Liang, Lu ; Niu, Zhenguo ; Huang, Xiaomeng ; Fu, Haohuan ; Liu, Shuang ; Li, Congcong ; Li, Xueyan ; Fu, Wei ; Liu, Caixia ; Xu, Yue ; Wang, Xiaoyi ; Cheng, Qu ; Hu, Luanyun ; Yao, Wenbo ; Zhang, Han ; Zhu, Peng ; Zhao, Ziying ; Zhang, Haiying ; Zheng, Yaomin ; Ji, Luyan ; Zhang, Yawen ; Chen, Han ; Yan, An ; Guo, Jianhong ; Yu, Liang ; Wang, Lei ; Liu, Xiaojun ; Shi, Tingting ; Zhu, Menghua ; Chen, Yanlei ; Yang, Guangwen ; Tang, Ping ; Xu, Bing ; Giri, Chandra ; Clinton, Nicholas ; Zhu, Zhiliang ; Chen, Jin ; Chen, JunInternational journal of remote sensing, 2013-04, Vol.34 (7), p.2607-2654 [Periódico revisado por pares]Abingdon: Taylor & FrancisTexto completo disponível |
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‘Structure-from-Motion’ photogrammetry: A low-cost, effective tool for geoscience applicationsWestoby, M.J. ; Brasington, J. ; Glasser, N.F. ; Hambrey, M.J. ; Reynolds, J.M.Geomorphology (Amsterdam, Netherlands), 2012-12, Vol.179, p.300-314 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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Geomorphons — a pattern recognition approach to classification and mapping of landformsJasiewicz, Jarosław ; Stepinski, Tomasz F.Geomorphology (Amsterdam, Netherlands), 2013-01, Vol.182 (15), p.147-156 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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Application of the topographic position index to heterogeneous landscapesDe Reu, Jeroen ; Bourgeois, Jean ; Bats, Machteld ; Zwertvaegher, Ann ; Gelorini, Vanessa ; De Smedt, Philippe ; Chu, Wei ; Antrop, Marc ; De Maeyer, Philippe ; Finke, Peter ; Van Meirvenne, Marc ; Verniers, Jacques ; Crombé, PhilippeGeomorphology (Amsterdam, Netherlands), 2013-03, Vol.186, p.39-49 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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A compilation of data on European flash floodsGaume, Eric ; Bain, Valerie ; Bernardara, Pietro ; Newinger, Olivier ; Barbuc, Mihai ; Bateman, Allen ; Blaškovičová, Lotta ; Blöschl, Günter ; Borga, Marco ; Dumitrescu, Alexandru ; Daliakopoulos, Ioannis ; Garcia, Joachim ; Irimescu, Anisoara ; Kohnova, Silvia ; Koutroulis, Aristeidis ; Marchi, Lorenzo ; Matreata, Simona ; Medina, Vicente ; Preciso, Emanuele ; Sempere-Torres, Daniel ; Stancalie, Gheorghe ; Szolgay, Jan ; Tsanis, Ioannis ; Velasco, David ; Viglione, AlbertoJournal of hydrology (Amsterdam), 2009-03, Vol.367 (1), p.70-78 [Periódico revisado por pares]Kidlington: Elsevier B.VTexto completo disponível |
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Critical width of tidal flats triggers marsh collapse in the absence of sea-level riseMariotti, Giulio ; Fagherazzi, SergioProceedings of the National Academy of Sciences - PNAS, 2013-04, Vol.110 (14), p.5353-5356 [Periódico revisado por pares]Washington, DC: National Academy of SciencesTexto completo disponível |
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Material Type: Artigo
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Gully erosion susceptibility assessment by means of GIS-based logistic regression: A case of Sicily (Italy)Conoscenti, Christian ; Angileri, Silvia ; Cappadonia, Chiara ; Rotigliano, Edoardo ; Agnesi, Valerio ; Märker, MichaelGeomorphology (Amsterdam, Netherlands), 2014-01, Vol.204, p.399-411 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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An adaptive inverse-distance weighting spatial interpolation techniqueLu, George Y. ; Wong, David W.Computers & geosciences, 2008-09, Vol.34 (9), p.1044-1055 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
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Material Type: Artigo
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Using a binary logistic regression method and GIS for evaluating and mapping the groundwater spring potential in the Sultan Mountains (Aksehir, Turkey)Ozdemir, AdnanJournal of hydrology (Amsterdam), 2011-07, Vol.405 (1), p.123-136 [Periódico revisado por pares]Kidlington: Elsevier B.VTexto completo disponível |
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Decadal trend of climate in the Tibetan Plateau--regional temperature and precipitationXu, Z.X ; Gong, T.L ; Li, J.YHydrological processes, 2008-07, Vol.22 (16), p.3056-3065 [Periódico revisado por pares]Chichester, UK: John Wiley & Sons, LtdTexto completo disponível |