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1 |
Material Type: Artigo
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0 + and 1 + heavy mesons in heavy chiral unitary approachShen, P.N. ; Guo, F.K. ; Chiang, H.C. ; Zou, B.S.Nuclear physics. A, 2007-06, Vol.790 (1), p.477c-480c [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
2 |
Material Type: Artigo
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0 + and 1 + states of B and B s mesonsMatsuki, Takayuki ; Mawatari, Kentarou ; Morii, Toshiyuki ; Sudoh, KazutakaPhysics letters. B, 2005-01, Vol.606 (3-4), p.329-334 [Periódico revisado por pares]Texto completo disponível |
3 |
Material Type: Artigo
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0+ and 1+ states of B and Bs mesonsMatsuki, Takayuki ; Mawatari, Kentarou ; Morii, Toshiyuki ; Sudoh, KazutakaPhysics letters. B, 2005-01, Vol.606 (3-4), p.329-334 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
4 |
Material Type: Artigo
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0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric EnvironmentsCecchetto, Matteo ; Alia, Ruben Garcia ; Wrobel, Frederic ; Coronetti, Andrea ; Bilko, Kacper ; Lucsanyi, David ; Fiore, Salvatore ; Bazzano, Giulia ; Pirovano, Elisa ; Nolte, RalfIEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.873-883 [Periódico revisado por pares]New York: IEEETexto completo disponível |
5 |
Material Type: Artigo
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0.13-[micro]m 32-Mb/64-Mb embedded DRAM core with high efficient redundancy and enhanced testabilityKikukawa, H ; Tomishima, S ; Tsuji, T ; Kawasaki, T ; Sakamoto, S ; Ishikawa, M ; Abe, W ; Tanizaki, H ; Kato, H ; Uchikoba, T ; Inokuchi, T ; Senoh, M ; Fukushima, Y ; Nirro, M ; Maruta, M ; Shibayama, A ; Ooishi, T ; Takahashi, K ; Hidaka, HIEEE journal of solid-state circuits, 2002-07, Vol.37 (7), p.932 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
6 |
Material Type: Artigo
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0.13-/spl mu/m 32-Mb/64-Mb embedded DRAM core with high efficient redundancy and enhanced testabilityKikukawa, H. ; Tomishima, S. ; Tsuji, T. ; Kawasaki, T. ; Sakamoto, S. ; Ishikawa, M. ; Abe, W. ; Tanizaki, H. ; Kato, H. ; Uchikoba, T. ; Inokuchi, T. ; Senoh, M. ; Fukushima, Y. ; Nirro, M. ; Maruta, M. ; Shibayama, A. ; Ooishi, T. ; Takahashi, K. ; Hidaka, H.IEEE journal of solid-state circuits, 2002-07, Vol.37 (7), p.932-940 [Periódico revisado por pares]IEEETexto completo disponível |
7 |
Material Type: Artigo
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0.13-μm 32-Mb/64-Mb embedded DRAM core with high efficient redundancy and enhanced testabilityKikukawa, H. ; Tomishima, S. ; Tsuji, T. ; Kawasaki, T. ; Sakamoto, S. ; Ishikawa, M. ; Abe, W. ; Tanizaki, H. ; Kato, H. ; Uchikoba, T. ; Inokuchi, T. ; Senoh, M. ; Fukushima, Y. ; Nirro, M. ; Maruta, M. ; Shibayama, A. ; Ooishi, T. ; Takahashi, K. ; Hidaka, H.IEEE journal of solid-state circuits, 2002-07, Vol.37 (7), p.932-940 [Periódico revisado por pares]Texto completo disponível |
8 |
Material Type: Artigo
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0.2 kb promoter sequence of the murine Cyp19 gene target β-galactosidase expression to specific brain areas of transgenic miceNausch, Norman ; Manteuffel, Gerhard ; Vanselow, JensThe Journal of steroid biochemistry and molecular biology, 2007-02, Vol.103 (2), p.119-128 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
9 |
Material Type: Artigo
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0.25- mu m pseudomorphic HEMTs processed with damage-free dry-etch gate-recess technologyRen, F. ; Pearton, S.J. ; Abernathy, C.R. ; Wu, C.S. ; Hu, M. ; Pao, C.-K. ; Wang, D.C. ; Wen, C.P.IEEE transactions on electron devices, 1992-12, Vol.39 (12), p.2701-2706 [Periódico revisado por pares]NEW YORK: IEEETexto completo disponível |
10 |
Material Type: Artigo
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0.2C-1.5Si-1.2Mn鋼のTRIP効果におよぼすひずみ速度の影響土田, 紀之 ; 尾﨑, 渓香鉄と鋼, 2013, Vol.99(8), pp.524-531 [Periódico revisado por pares]一般社団法人 日本鉄鋼協会Texto completo disponível |